Automatic defect classification (ADC) solution using data-centric artificial intelligence (AI) for outgoing quality inspections in the semiconductor industry | SPIE Advanced Lithography + Patterning
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Design based automatic defect classification at advanced technology nodes: DI: Defect inspection and reduction | Semantic Scholar
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A voting-based ensemble feature network for semiconductor wafer defect classification | Scientific Reports
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Applied Sciences | Free Full-Text | Automated Defect Detection Using Threshold Value Classification Based on Thermographic Inspection
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Applied Sciences | Free Full-Text | A Deep Convolutional Neural Network-Based Multi-Class Image Classification for Automatic Wafer Map Failure Recognition in Semiconductor Manufacturing
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Effective automatic defect classification process based on CNN with stacking ensemble model for TFT-LCD panel | SpringerLink
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Automatic Defect Inspection Using the NVIDIA End-to-End Deep Learning Platform | NVIDIA Technical Blog
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Automatic Defect Inspection Using the NVIDIA End-to-End Deep Learning Platform - Edge AI and Vision Alliance
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Table I from SEM ADC (Auto Defect Classification): How it improves the Cost of Ownership without Risk of Yield Loss | Semantic Scholar
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Design based automatic defect classification at advanced technology nodes: DI: Defect inspection and reduction | Semantic Scholar
![6. Block diagram of the proposed automatic defect classification scheme... | Download Scientific Diagram 6. Block diagram of the proposed automatic defect classification scheme... | Download Scientific Diagram](https://www.researchgate.net/publication/265071716/figure/fig4/AS:669406837346309@1536610435285/Block-diagram-of-the-proposed-automatic-defect-classification-scheme-for-non-wet-joints.png)